Author: Wendong Zhang, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jing Chen, Liguo Chen, Dachao Li, Chenyang Xue Full Title: Measurement Technology For Micro-Nanometer Devices Publisher: Wiley-Blackwell (1 Dec. 2016) Year: 2017 ISBN-13: 9781118717967 (978-1-118-71796-7) ISBN-10: 1118717961 Pages: 352 Language: English Genre: Electrical & Electronics Engineering: Circuit Theory & Design File type: PDF (True but nonnative Cover) Quality: 9/10 Price: 144.00 € A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale ░ Highlights the advanced research work from industry and academia in micro-nano devices test technology ░ Written at both introductory and advanced levels, provides the fundamentals and theories ░ Focuses on the measurement techniques for characterizing MEMS/NEMS devices ░ Companion website includes Lab View soft, micro-vision system test software, and algorithm software, enhancing the learning experience ------------- Our members see more. Join us!
