Wiley - Advanced Characterization Techniques For Thin Film..., 2 Volumes, 2nd Edition (2016 EN)

Author: Daniel Abou-Ras (Editor), Thomas Kirchartz (Editor), Uwe Rau (Editor)
Full Title: Advanced Characterization Techniques For Thin Film Solar Cells, 2 Volumes, 2nd Edition
Publisher: Wiley-VCH; 2 edition (October 10, 2016)
Year: 2016
ISBN-13: 9783527339921 (978-3-527-33992-1)
ISBN-10: 3527339922
Pages: 760
Language: English
Genre: Physics: Materials Characterization
File type: PDF (True, but nonnative Cover)
Quality: 9/10
Price: 216.00 €


The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.

Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

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