Author: Yutaka Yoshida (Editor), Guido Langouche (Editor) Full Title: Defects And Impurities In Silicon Materials: An Introduction To Atomic-Level Silicon Engineering Publisher: Springer; 1st ed. 2015 edition (April 19, 2016) Year: 2015 ISBN-13: 9784431558002 (978-4-431-55800-2), 9784431557999 (978-4-431-55799-9) ISBN-10: 4431558004, 4431557997 Pages: 487 Language: English Genre: Condensed Matter Physics File type: PDF (True) Quality: 10/10 Price: 46.79 € This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved. ------------- Damnant quod non intellegunt!